IOLTS 2007 - Call for Papers

CALL FOR PAPERS

Scope and Purpose -- Submissions -- About the Location -- Contact -- Committees

Scope and Purpose

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins and process parameters variations and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer Society Test Technology Technical Council and organized by TIMA Laboratory, University of Athens and University of Piraeus.

The topics include (but are not limited to) the following ones:

Reliability issues in nanometer technologies
On-line testing of analog and mixed signal circuits
On-line test in the continuous operation of large systems
On-line testing in automotive, railway, avionics, industry
On-line current, temperature, etc, monitoring
On-line and off-line BIST
Self-checking circuits and coding theory
Field diagnosis, maintainability and reconfiguration
Dependable systems design
Dependability evaluation
Synthesis of on-line testable circuits
Fault-tolerant and fail-safe systems
On-line power monitoring and control
Radiation effects
Secure circuit design
Fault-based attacks and counter measures

Submissions

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The IOLTS Program Committee invites authors to submit papers in the above or related technical areas. Accepted papers will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically via the Symposium web site.

The IEEE Transactions on Dependable and Secure Computing (TDSC) is actively soliciting high quality papers in the areas of hardware dependability and security. IOLTS 2007 authors will be invited to submit archival versions of their papers for consideration for publication in IEEE TDSC.

Please observe the following key dates:

Submission deadline: February 10, 2007
Notification of acceptance: March 30, 2007
Camera-ready papers due: April 25, 2007

About the Location

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Crete is the fifth largest island in the Mediterranean sea and lies at the point where the continents of Europe, Asia and Africa meet. It has been cultivated for thousands of years and has important Minoan, Greek, Roman and Byzantine archaeological sites. The historical aspects combine with the scenic landscapes of mountains, valleys, and sea to make Crete a beautiful and fascinating area with probably the mildest climate in Europe. IOLTS will be held in Creta Maris Resort on the Cretan Sea that combines Aegean architecture and luxurious facilities. It is situated 24km east of Heraklion International Airport and it is close to the fishing village of Hersonissos, a long sweeping bay of sandy beach and crystal clear water.

Contact

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Submission Information

Dimitris Gizopoulos
University of Piraeus
Department of Informatics
80 Karaoli & Dimitriou Str.
18534, Piraeus, Greece
Tel: +30 210 4142372
dgizop@unipi.gr

T.M.Mak
Intel
2200 Mission College Blvd
SC12-604, Santa Clara
CA 95051, USA
Tel: +1 408-765-4543
t.m.mak@intel.com

General Information

Antonis Paschalis
University of Athens
Dept. of Informatics & Telecom.
Panepistimiopolis
15784 Athens, Greece
Tel: +30 210 727 5231
paschali@di.uoa.gr

Michael Nicolaidis
TIMA Laboratory
46, av. Felix Viallet
38031 Grenoble
France
Tel: +33 (0) 4 76 57 46 96
Michael.Nicolaidis@imag.fr

Committees

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ORGANIZING COMMITTEE

General Chairs
M. Nicolaidis, TIMA Laboratory
A. Paschalis, U. Athens

Program Chairs
D. Gizopoulos, U.Piraeus
T.M. Mak, Intel

Vice-General Chairs
C. Metra, U. Bologna
Y. Zorian, Virage Logic

Vice-Program Chairs
R. Aitken, ARM
R. Leveugle, TIMA Laboratory

Finance Chair
M. Psarakis, U. Piraeus

Panels Chair
L. Anghel, TIMA Laboratory

Local Chair
N. Kranitis, U. Athens

Publicity Chair
R. Velazco, TIMA Laboratory

Publications Chair
E. Simeu, TIMA Laboratory

Audio Visual Chair
G. Xenoulis, U. Piraeus

ETTTC Liaison
Z. Peng, Linköping U.

PROGRAM COMMITTEE

J. Abraham, U. Texas at Austin
R. Baumann, Texas Instruments
E. Boehl, Robert Bosch GmbH
C. Bolchini, Poli. di Milano
D. Bradley, ARM
A. Bystrov, U. Newcastle
S. Chakravarty, Cswitch
Y. Crouzet, LAAS
A. Dandache, U. Metz
P. Fouillat, IXL-ENSEIRB
P. Girard, LIRMM
M. Goessel, U. Postdam
T. Haniotakis, U. Southern Illinois
J. Hayes, U. Michigan
T. Heijman, NXP Semiconductors
S. Hellebrand, U. Paderborn
A. Ivanov, U. Brit. Columbia
R. Iyer, U. Illinois Urbana
H. Konuk, Broadcom
A. Krasniewski, Warsaw U. T.
S. Kundu, U. Mass. Amherst
C. Landrault, LIRMM
Y. Makris, Yale U.
S. Mitra, Standford U.
D. Nikolos, U. Patras
P. Pande, Washington State U.
I. Parulkar, Sun
B. Paul, Toshiba
M. Pflanz, IBM Germany
S. Piestrak, U. Metz
M. Pignol, CNES
D. Pradhan, U. Bristol
P. Prinetto, Poli. di Torino
M. Rebaudengo, Poli. di Torino
K. Roy, Purdue U.
P. Sanda, IBM
J. Segura, U. Illes Balears
J. P. Seifert, U. of Innsbruck
N. Seifert, Intel
M. Sonza Reorda, Poli. di Torino
J. Sosnowski, Warsaw U. T.
L. Sourgen, ST Microelectronics
B. Straube, Fraunhofer IIS/EAS
J. P. Teixeira, IST/INESC-ID
N. Touba, U. Texas
S. Tragoudas, U. Southern Illinois
Y. Tsiatouhas, U. Ioannina
F. Vargas, PUCRS
I. Verbauwhede, K. U. Leuven
M. Violante, Poli. di Torino
A. Wood, Sun
H. J. Wunderlich, U. Stuttgart
M. Zhang, Intel

For more information, visit us on the web at: http://tima.imag.fr/conferences/iolts/

The 13th IEEE International On-Line Testing Symposium (IOLTS'07) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC), and co-organized by the TTTC On-line Testing TAC and the European Group of TTTC, in collaboration with TIMA Laboratory and University of Bologna.